ABOUT BAManalysis, speciation and nanoparticle analysis via ICP-MS. 202000669 BAM Medienteam ABOUT...

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CONTACT Bundesanstalt für Materialforschung und -prüfung (BAM) Division 1.1 Inorganic Trace Analysis Dr. Björn Meermann [email protected] and Marcus von der Au [email protected] IMPORTANT INFORMATION DATE November 12 th to 13 th , 2020 CONFERENCE VENUE MS Teams Link for the participation will be send after the registra- tion deadline CONFERENCE LANGUAGE English ABSTRACT SUBMISSION DEADLINE October 12 th , 2020 REGISTRATION DEADLINE October 31 st , 2020 ABOUT BAM BAM – DIVISION 1.1 “INORGANIC TRACE ANALYSIS” The Federal Institute for Materials Research and Test- ing (Bundesanstalt für Materialforschung und -prü- fung, BAM) is a senior scientific and technical Federal research institute. It tests, researches and advises to protect people, the environment and material goods. BAM comprises broad as well as considerable exper- tise in the area of Analytical Chemistry. All areas of Analytical Chemistry are covered within Department 1 – protein, food and environmental analysis, organic and inorganic trace analysis, chemical and optical sensing, and biophotonics. In particular Division 1.1 “Inorganic Trace Analysis” has considerable expertise in elemental (ultra-)trace analysis, speciation and nanoparticle analysis via ICP-MS. 202000669 BAM Medienteam

Transcript of ABOUT BAManalysis, speciation and nanoparticle analysis via ICP-MS. 202000669 BAM Medienteam ABOUT...

Page 1: ABOUT BAManalysis, speciation and nanoparticle analysis via ICP-MS. 202000669 BAM Medienteam ABOUT TOFCON The TOFCON is the 1st meeting focused on the ICP-ToF-MS community. The main

CONTACT Bundesanstalt für Materialforschung und -prüfung (BAM) Division 1.1 Inorganic Trace Analysis Dr. Björn Meermann

[email protected] and Marcus von der Au

[email protected]

IMPORTANT INFORMATION

DATENovember 12th to 13th, 2020

CONFERENCE VENUEMS TeamsLink for the participation will be send after the registra-tion deadline

CONFERENCE LANGUAGEEnglish

ABSTRACT SUBMISSION DEADLINEOctober 12th, 2020

REGISTRATION DEADLINEOctober 31st, 2020

ABOUT BAM

BAM – DIVISION 1.1 “INORGANIC TRACE ANALYSIS”The Federal Institute for Materials Research and Test-ing (Bundesanstalt für Materialforschung und -prü-fung, BAM) is a senior scientific and technical Federal research institute. It tests, researches and advises to protect people, the environment and material goods.BAM comprises broad as well as considerable exper-tise in the area of Analytical Chemistry. All areas of Analytical Chemistry are covered within Department 1 – protein, food and environmental analysis, organic and inorganic trace analysis, chemical and optical sensing, and biophotonics.

In particular Division 1.1 “Inorganic Trace Analysis” has considerable expertise in elemental (ultra-)trace analysis, speciation and nanoparticle analysis via ICP-MS.

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Page 2: ABOUT BAManalysis, speciation and nanoparticle analysis via ICP-MS. 202000669 BAM Medienteam ABOUT TOFCON The TOFCON is the 1st meeting focused on the ICP-ToF-MS community. The main

ABOUT TOFCON

The TOFCON is the 1st meeting focused on the ICP-ToF-MS community. The main objective is to provide a plat-form for the exchange of experience among the users in open discussions on the technology and its application. Besides the presentation of current research results it is desired to discuss issues and ideas for new develop-ments and application fields by means of ICP-ToF-MS.

All participants will be given the opportunity to present their work in the form of a talk. Topic could be amongst others related to new insights regarding the theoretical background, practical experiences, method develop-ment, and applications. Focus will be given to discus-sions between the participants and developers and TOFWERK representatives besides lectures. Participants are encouraged to present also “negative” results of their research efforts or share unresolved hypotheses with the audience for fruitful discussions.

Furthermore, it is planned during the 2nd day of the meeting a short hands-on course within the labs of Divion 1.1 on the ICP-ToF-MS and a new and automated microdroplet sample introduction system via a virtual lab tour. This enables room for further discussions on technical aspects of ICP-ToF-MS as well as specific fields of application. In additon, if the purchase of such a de-vice is planned in the future, this is the possibility to get a first look at the system and mode of action.

PROGRAM SCHEDULE

PRELIMINARILY PLANNED PROGRAM

Thursday, November 12th, CET01:45 pm – 02:00 pm: Check-In02:00 pm – 02:15 pm: Welcome02:15 pm – 02:45 pm: Introduction02:45 pm – 03:15 pm: Keynote lecture (NN)03:15 pm – 03:45 pm: Coffee break03:45 pm – 05:00 pm: Oral presentations – Session I05:00 pm – 06:00 pm: Coffee break 06:00 pm – 06:30 pm: New developments & software06:30 pm – 07:00 pm: Discussion “round table”

Friday, November 13th; CET 02:00 pm – 03:15 pm: Oral presentations – Session II03:15 pm – 03:45 pm: Coffee break03:45 pm – 06:00 pm: Hands on: MDG-ICP-ToF-MS06:00 pm – 06:30 pm: Coffee break 06:30 pm – 07:00 pm: Final discussion07:00 pm – 07:30 pm: Farewell reception

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