符合IPC TM 650 2.6.26的測試要求。IST系統係利用直流電流加入到測試試片內，外層的互連線路結構上，監視以及控制該測試試片在每一次熱應力循環測試過程中的電阻/溫度的變化，測試試片中的導通孔會被加熱直到超過材料的玻璃轉換溫度(Tg)諸如150℃+/-3℃在3分鐘內。

在不同的熱膨脹變化是被產生且連續性的試驗直到故障開始發生於導通孔內，即所謂微小破裂在孔環/內層連接點上，系統會持續的測試直到其中測試規格不符合要求。測試試片的測試判讀標準可以以最大的測試循環週期判讀或以導通孔/內層連接點的電阻提升率的比值來判讀。

另外配合非破壞式的量測方法進行PCB上的孔破定位，可檢測出的孔破種類如下：

(1)鍍通孔 / Plated Throngh Hole(2)盲孔 / Blind Via Hole(3)埋孔 / Buried Via Hole

IST測試試片孔破定位

IST,IST,導通孔互連熱應力測試系統導通孔互連熱應力測試系統

測試原理說明:

Model : IST-HC Brand : PWB

切片分析

AccessoriesAccessories1. Thermal Imaging System

測試溫度範圍

0℃ to 150℃ ( 32℉ to 302℉ )0℃ to 250℃ ( 32℉ to 482℉ ) high temperature option0℃ to 150℃ ( 32℉ to 302℉ ) extended temperature option

量測準確性

< +/-2 ℃ ( +/-3.6 ℉ ) of indicated temperature

2. DELAM

測試溫度範圍

23°C +/-3°C ( 73℉ +/-5℉ )

量測準確性 +/- 0.5%

範圍 100pf – 1000pf

得邁斯儀器 @ 2011 Asia Qtech Instrument Inc. All Rights Reserved

分層切片

IST 試片設計原理說明:

Certain design rules must be followed to ensure test vehicle compatibility with the IST System. The coupon design must contain 2 independent circuits that are thermally uniform and within the specified resistance range of the IST system.

The basic concept used for IST test coupon design requires 2 independent circuits. The first receives DC current (direct heat or power circuit), the second (indirect heat or sense circuit) is used to

monitor and determine coupon temperature.

The Power Circuit is created on four internal layers, positioned at layers 2, 3, N-1 and N-2. The interconnect is daisy chained through each pair of layers (2 and 3 or N-1 and N-2), throughout the length and width of the coupon.

The Sense Circuit is positioned adjacent to the direct heat, using identical design attributes. The interconnect is daisy chained through various layers, generally connecting between the 2 outer layers.

The standard IST test coupon consists of the following interconnect design.

Power Circuit: - 200 Daisy Chain Vias, interconnecting through 2 adjacent layers (2&3 / n-1&n-2). Minimize dielectric spacing to reduce interference from PTH barrel failure zones (.006” - .008” optimum).

Sense Circuit (PTH Interconnect): - 2 (parallel resistor) independent daisy chains, interconnecting 500 Vias through any 2 inner layers at various levels within the PWB (1&7 2&6 / 3&5 etc…)

Sense Circuit (PTH Interconnect) runs parallel to and sequentially overlap the Power circuits.

得 邁 斯 儀 器 股 份 有 限 公 司

總公司(台北)：台北市中山區明水路672巷36號3樓 Tel: 886-2-85021096 Fax: 886-2-85021097 得邁斯(上海)：上海市園南二村76號604室 Tel: 86-21-54144780 Fax: 86-21-54144780 得邁斯(安聯電子)：珠海市吉大石花西路38號1019室 Tel: 86-756-3881886 Fax: 86-756-3881801

得邁斯儀器 @ 2011 Asia Qtech Instrument Inc. All Rights Reserved