AG Mikrostrukturanalytik Activities and Results 2009

Annual Report 01.01.2009 – 31.12.2009

Almanach 09 Technische Fakultät Christian-Albrechts-Universität zu Kiel

Ed. Dekanat Technische Fakultät

Available online at www.tf.uni-kiel.de

Prof. Dr. Wolfgang Jäger Mikrostrukturanalytik / Microanalysis of Materials Institut für Materialwissenschaft / Institute of Materials Science

Adress Kaiserstr. 2, D-24143 Kiel, Germany EU tel +49 (0)431 880 6177 fax +49 431 880 6178 wj@tf.uni-kiel.de Office Katrin Brandenburg tel +49 (0)431-880-6176 fax +49 431-880-6178 kb@ tf.uni-kiel.de www.tf.uni-kiel.de

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tf���Microanalysis of Materials

Research Focus and Methods: Our research projects aim at the understanding of microstructure-property relationshipsof functional materials and the synthesis of fundamental research, quantitative methodological approaches, and theirapplications in technology-oriented material developments. Particular emphasis is put on

- Microstructure research of thin film systems, interfaces, defects, and nanomaterials

- Quantitative methods of high-resolution and analytical transmission electron microscopy

- Nanoanalytics with electrons in materials and surface science

The Center of Materials Analysis (CMA) and the �Kieler Nanolabor� of the CAU (see TF almanach 2008) provide accessto a number of methods for the nanoanalysis of materials. Techniques predominantly used in our research projects arethe advanced high-resolution imaging (HRTEM, STEM/HAADF, EFTEM) and spectroscopic (EELS/ELNES, EDXS) methodsof transmission electron microscopy (TEM), state-of-the-art image simulation, digital image analysis methods, as wellas dual-beam FIB / SEM / EDX methods for focussed ion beam (FIB) TEM specimen preparation. The central instrumentof the central TEM laboratory - coordinated by Dr. Andriy Lotnyk - is a FEI TECNAI F30 analytical transmission electronmicroscope, equipped with a GATAN GIF / TRIDIEM 863 Imaging Energy Filter with Multi-Scan CCD Cameras, and withspecimen holders for temperature control and electron tomography for 3D object reconstruction. Software packages forstate-of-the-art image simulation, digital image analyses, spectral data analyses, and exit-wave reconstruction from focalseries, assist in the evaluation of the experimental data. Furthermore, a conventional Philips CM30 transmission electronmicroscope CTEM, a FEI XL 30 scanning electron microscope, and laboratories for conventional TEM specimen preparation- coordinated by Ms. C. Szillus - are available.

Course Teaching and Research Thesis Projects: Study courses for Bachelor and Master Students (teaching languagesEnglish, German) in the subject areas Materials Science, Analytical Methods in Materials Science, and Advanced Methods ofTransmission Electron Microscopy. Offers for thesis projects for Bachelor and Master students, and for Dissertation projects.

Collaboration Offers for Research and Technology: R&D collaboration with research institutions and with industry.Consulting and expert advice. Funded project research and transfer of technology. Continuing education �Analytics ofMaterials for Research and Industry / Materialanalytik für Forschung und Industrie� (Prof. W. Jäger, teaching languagesGerman / English), www.uni-kiel.de/wiss-weiterbildung.

� Results

We have applied advanced high-resolution imaging and spectroscopic techniques of transmission electron microscopy(conventional and aberration-corrected high-resolution TEM, electron diffraction, high-resolution STEM, and spectroscopicEDXS and EELS analyses) in comprehensive and quantitative research on interfaces, surfaces, and nanomaterials. Thetopics as follows:

- Quantitative TEM of Multilayers for Commercial Synchrotron Optics (methodological development oriented towardstechnology support)

- TEM of Nanoparticle Materials (applied nanoanalytical studies):

Metallic Core-Shell Nanoparticles

Nanocrystalline Diamond

- Functional Doped Oxide Semiconductor Nanostructures (fundamental research)

- TEM for Improved High-Efficiency Solar Cells (fundamental studies)

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tf���A. QUANTITATIVE TEM OF MULTILAYERS FOR COMMERCIAL SYNCHROTRON OPTICS

Diploma thesis project: Ulrich Roÿ. Dr. D Häuÿler CAU. Cooperations: Dr. M. Störmer, Institute of Materials Research,GKSS Forschungszentrum Geesthacht GmbH, Germany. Dr. J. Wiesmann, F. Hertlein, U. Heidorn, Incoatec GmbH,Geesthacht, Germany. Funding support by the ISH Innovationsstiftung Schleswig-Holstein (contract 2007-13H) isgratefully acknowledged. Dr. C. Morawe, ESRF Grenoble, France.

As part of our continued collaboration with the INCOATEC GmbH Geesthacht and the GKSS Helmholtz-Centre Geeshacht,Institute for Materials Research, we explored quantitative characterisations by scanning transmission electron microscopy(STEM) in order to enable the assessment of the layer growth, the coating control, and the reflectivity properties ofmultilayer systems for X-ray optics. More recent investigations focussed on characterisations for developing state-of-the-artthin film X-ray optical multilayer coatings for advanced X-ray analytical equipment and for conventional synchrotron beamlines and FEL sources. The development and fabrication of multilayer coatings for X-ray optics are an excellent exampleof nanotechnology with a large interdisciplinary scope addressing new products for advanced applications in materialsscience, semiconductor industries, as well as in life science (please see www.incoatec.de for examples of products andapplications).

Fig. 1: QUANTITATIVE STEM OF APERIODIC MULTILAYER MIRRORS FOR SYNCHROTRON OPTICS. Example of HAADF-STEMcross-section micrograph displaying the section of a tungsten (W) - carbon (C) multilayer system on a silicon (Si)

substrate. STEM image taken along the <110> silicon projection in a FEI TECNAI F 30 operated at 300 kV. Insert:Colour coded bi-layer thickness distribution obtained from the analyses of the STEM image.

Periodic multilayer systems consisting of ultrathin bilayers on the nanometer scale constitute the basis for monochromatorsof small spectral bandwidth. Aperiodic multilayer systems are used as advanced X-ray optical components for large spectralbandwidth synchrotron applications. The development of these novel multilayer systems requires precise monitoring of themultilayer parameters, such as layer thickness, layer periodicity and uniformity, and interface quality. High-angle annulardark-field scanning TEM (HAADF-STEM) was applied to cross-section imaging of periodic and aperiodic W/C multilayersystems and their interfaces (Fig. 1) and was combined with analyses of image intensity profiles. It is shown that the locallayer thickness can be determined with sub-nanometer precision. Both methods lead to good agreement with nominaldata, except for layer systems containing near-substrate growth-induced thickness fluctuations. Analyses of the positionand the width of the interface contrast were employed for the quantitative determination of the interface roughness. This

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tf���procedure yields separate values for the lateral interface roughness and for interface broadening. For periodic multilayersystems the results show also excellent agreement with data obtained from X-ray reflectivity measurements.

B. TEM OF NANOPARTICLE MATERIALS - Metallic Core-Shell Nanoparticles

Cooperations: Dr. B. Schaffer, Dr. F. Hofer, Institute for Electron Microscopy, Graz University of Technology, Graz, Austriaand SuperSTEM Facility Daresbury UK. Dr. D. Häussler CAU. M.Sc. Fu Liu, Prof. X. Zhang, Dept. Materials Science andEngineering, Zhejiang University, Hangzhou, China.

Fig. 2: STEM SPECTRUM IMAGING (SI) ANALYSES OF PALLADIUM -TIN NANOPARTICLES WITH CORE-SHELL STRUCTURE.STEM-HAADF image (left), STEM EDX SI taken with tin (Sn) signal (center) and STEM EDX SI taken with palladium (Pd)signal (right). For the region marked by crosses the EDS spectrum is displayed below. The analysis shows a high fractionof Pd in the core region and a high fraction of Sn in the shell region, thus confirming earlier studies with an FEG-TEM thatis equipped with an HR-imaging filter [TF Almanach 2007]. In addition the effects of possible contaminations during

particle processing by other than nominal elements is detected.

Metallic core-shell nanoparticles for applications in catalysis and as data storage materials offer the possibility to tailormacroscopic properties generally not obtained by the single-component particles. Pd-Sn core-shell nanoparticles werefabricated by a solution-impregnation method on multi-wall carbon nanotubes and characterized by a combination ofvarious spectroscopic and imaging high resolution transmission electron microscope (TEM) methods as well as by electronnano-diffraction. Our methodological approach demonstrates the feasibility to precisely analyse and map structure,morphology, and chemical composition of such particles (Fig. 2). It turns out that for the palladium-tin system compositionanalyses by electron-energy loss spectroscopy (EELS) are aggravated by overlapping ionization edges and suffer fromlimited detection sensitivity whereas energy-dispersive X-ray microanalyses (EDX) with high spatial resolution revealsmall spectral signal-to-noise ratios. The scanning TEM high-angle-annular dark-field (HAADF) image contrast allowsdistinguishing Sn from Pd and other lighter elements due to the strong atomic number (Z) dependence of electronscattering to high angles and imaging of atom columns. Electron nano-diffraction patterns provide additional informationabout the particle structure. Our analyses of a number of Sn-Pd particles with diameters as small as 20 nm reveal thatboth polycrystalline particles with Pd-rich cores and oxidized shells that mainly contain Sn as well as polycrystalline alloyparticles are formed.

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tf���C. TEM OF NANOPARTICLE MATERIALS - Nanocrystalline Diamond

Cooperation: Dr. O. Williams, Dr. A. Kriele, Prof. Ch. Nebel, Fraunhofer Institute for Applied Solid State Physics FHG-IAF.Dipl.-Ing. Ch. Dieker CAU.

Diamond foam from Nano-Crystalline Diamond (NCD) Films is promising for demanding applications such as fuel cells,water purification systems, and molecular traps where chemical stability, biocompatibility and longevity are required.Nano-crystalline diamond prepared by chemical vapour deposition (CVD) consists of diamond crystals (sp3 bonding ofcarbon) surrounded by non-diamond carbon (sp2 bonding). The ratio of sp2/sp3 is controlled by variation of the ratioCH4/H2 during the CVD growth. Thermal annealing in air is applied to remove graphite and amorphous carbon and togenerate a porous foam structure with sub-nanometer voids in the film. The microstructure of NCD and the effects ofthermal annealing are characterized by high-resolution TEM, by selected area electron diffraction (SAED) and by electronenergy loss spectroscopy (EELS), and the propagation of ions through voids is investigated.

D. OXIDE SEMICONDUCTOR NANOMATERIALS

Cooperation: Prof. Dr. J. Piqueras, Prof. Y. Ortega Villafuerte, Dr. D. Maestre Varea, Physics Department, UniversidadComplutense de Madrid, Spain. Dipl.-Ing. Ch. Dieker, Dr. Dietrich Häussler CAU.

Fig. 3: FUNCTIONAL DOPED ZINC OXIDE (ZnO) NANOSTRUCTURES. (left) Bright-field TEM micrograph of single Sn-dopedZnO nanorod showing hollow core regions, regions consisting of Sn-rich material, and surface nanocrystals. (right)

Spatially-resolved EDX spectrum displaying the presence of Sn and of traces of S in the core region.

Advanced imaging and spectroscopic techniques of electron microscopy play a crucial role in characterizing themicrostructure and the structure-property relationships of nanostructured functional materials and interfaces. Oxidesemiconductor nanostructured materials, such as ZnO, In2O3, or SnO2 nanostructures, were grown by catalyst-free vapoursolid growth from different precursors. The morphology and the cathodoluminescence (CL) were investigated in a SEMequipped with a cathodoluminescence (CL) spectrometer. The structure and the interface phenomena were investigatedfor a variety of rod-like nanostructures by bright-field, dark-field, and high-resolution TEM imaging and combinedwith composition analyses by energy-dispersive x-rax microanalysis (EDX). ZnO as functional material is of interest astransparent window in solar cells, in ultra-violet (UV) lasers and light emitting diodes, or as field emitters in flat-paneldisplays. For doped ZnO, the CL investigations reveal locally varying emission intensities with a maximum intensity fromthe core region of the nanostructures. A broad emission band visible in the CL spectra suggests the presence of defects.The TEM investigations reveal that, for the case of Sn- and Al-doping, the rod-like nanostructures are characterized bydistinct core and shell regions, with the core regions frequently containing either voids or other defects. Void formationappears to be absent for rod-like Eu-doped ZnO nanostructures. As example, Fig. 3 shows a single nanorod structurewith a hollow core next to a core region enriched in Sn. In addition, the surfaces are decorated by nanocrystals. Thespatially resolved EDX measurement clearly indicates the presence of Sn in this region (as opposed to the adjacent hollow

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tf���region). Small amounts of S are also detected (the Cu signal results from the TEM support grid). High-resolution latticeimages taken from a near-tip region of the rod-like ZnO nanostructures are consistent with the ZnO wurtzite structure. ForSn-doped ZnO nanostructures, the comparison between TEM and CL investigations suggests that the spatial and spectraldistribution of CL intensity can be correlated with the presence of defects in a core-shell arrangement in different regions ofthe nanostructures.

E. TEM FOR IMPROVED HIGH-EFFICIENCY SOLAR CELLS

Cooperation: Dr. F. Dimroth, Dr. A. Bett, Fraunhofer Institute for Solar Energy Systems FHG-ISE Freiburg. Dipl.-Ing. Ch.Dieker.

Our investigations aiming at the development of new concepts for defect engineering and at the control of strain inheteroepitaxial crystal layer growth for high-efficiency solar cells were continued. Highest efficiencies for solar energyconversion are currently achieved for so-called metamorphic solar cell structures which consist of crystalline layer stacksbased on III-V compound semiconductor materials on germanium and on silicon substrates. A prerequisite for achieving thehighest efficiencies are active regions of the solar cell that remain relatively free of defects. Concentrating the sun light ontothe small area of such solar cells by an appropriate lens system leads to even higher efficiencies. This technique is appliedin photovoltaic concentrator systems and is of interest for solar energy power stations in countries with high solar radiationand for power generation in satellites. By using a GaInP/GaInAs layer structure on a Ge substrate and by concentrating thesunlight by a factor of 454 onto a small 5 mm2 multi-junction solar cell made from this system, the researchers at theFraunhofer Institute for Solar Energy Systems ISE have achieved an efficiency of 41.1 % for the conversion of sunlight intoelectricity. This represented a world record in efficiency (as of Jan14, 2009) reached for multi-junction solar cells. Presentmicrostructure research focuses on GaInNAs layer systems with different N contents and GaInP buffer layer systems.

� Personnel

Head of the group: Prof. Dr. Wolfgang Jäger; Secretary: Katrin Brandenburg (50%)

Scientific Staff:

Dipl.-Ing. Christel Dieker 01.03.-31.12.2009 CAUTEM of layer systems and nanomaterials and preparation for TEM

Dr. Dietrich Häuÿler 01.01.-31.12.2009 ISH bis 31.08.2010, CAUAnalytical TEM of layer systems and nanomaterials

M.Sc. Fu Liu 06.04.-30.09.2009 CAU International CenterGuest Scientist, Universität Zhejiang, Hangzhou, V. R. China

Dr. David Maestre Varea 05.05.-31.12.2009 Ministerio de Ciencia e innov.Guest scientist, Facultad de Ciencias Fisicas, UCM - Universidad Complutense Madrid, Spain

Dr. Yanicet Ortega Villafuerte 10.02.-31.07.2009 Ministerio de Ciencia e innov.Guest scientist, Facultad de Ciencias Fisicas, UCM - Universidad Complutense Madrid, Spain

M.Sc. Burcu Ögüt 01.01.-31.12.2009Investigations of metallic nanomaterials by energy-filter TEM (co-supervision of external Dissertation researchwork by Prof. W. Jäger, in collaboration with Max-Planck-Institut für Metallforschung, Stuttgart, Dr. P. Van Aken)

M.Sc. V. Burak Özdöl 01.01.-31.12.2009Transmission electron microscopy of Si-Ge heterostructures (co-supervision of external Dissertation research workby Prof. W. Jäger, in collaboration with Max-Planck-Institut für Metallforschung, Stuttgart, Dr. P. Van Aken)

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tf���� Lectures, Seminars, and Laboratory Course Offers

Winter 2008/2009

Transmission Electron Microscopy I, 2 (+1) hrs Lecture (+ Exercises)/Week,Wolfgang Jäger

Analytical Methods in Materials Research, 2 hrs Seminar/Week,Wolfgang Jäger

Materialwissenschaft III, 3 (+1) hrs Lecture (+ Exercises)/Week,Wolfgang Jäger

Laboratory Course: Scientific Methods, 4 hrs Lab/Week,Kai Dolgner (+ Andreas Schütt, Dirk Meyners, Vladimir Zaporojtchenko, Muhammad Qasim Shaikh, Seid Jebril, AlaCojocaru, Dietrich Häuÿler, Ulrich Roÿ)

Praktikum: Analytische Methoden, 4 hrs Lab/Week,Kai Dolgner (+ Marlies Schwitzke, Klaus Rätzke, Dirk Meyners, Mady Elbahri, Malte Leisner, Dietrich Häuÿler, Ulrich Roÿ)

Summer 2009

Analytics II, 2 (+1) hrs Lecture (+ Exercises)/Week,Wolfgang Jäger

Transmission Electron Microscopy II, 2 (+1) hrs Lecture (+ Exercises)/Week,Wolfgang Jäger

Microstructure Research of Thin Films and Nanostructures, 2 hrs Seminar/Week,Wolfgang Jäger

Einführung in die Materialanalytik, 2 hrs Lecture/Week,Wolfgang Jäger

Laboratory Course: Functional Materials, 4 hrs Lab/Week,Kai Dolgner (+ Mohammed Qasim Shaikh, Amit Kulkarni, Malte Leisner, Andriy Lotnyk, Dietrich Häuÿler)

Winter 2009/2010

Analytics I, 2 (+1) hrs Lecture (+ Exercises)/Week,Wolfgang Jäger

Transmission Electron Microscopy I, 2 (+1) hrs Lecture (+ Exercises)/Week,Wolfgang Jäger

Analytical Methods in Materials Research, 2 hrs Seminar/Week,Wolfgang Jäger

Materialwissenschaft III, 3 (+1) hrs Lecture (+ Exercises)/Week,Wolfgang Jäger

Laboratory Course: Scientific Methods, 4 hrs Lab/Week,Kai Dolgner (+ Vladimir Zaporojtchenko, Mohammed Qasim Shaikh, Seid Jebril, Ala Cojocaru, Dietrich Häuÿler, MalteLeisner)

Praktikum: Analytische Methoden, 4 hrs Lab/Week,Kai Dolgner (+ Marlies Schwitzke, Klaus Rätzke, Dirk Meyners, Mady Elbahri, Malte Leisner, Dietrich Häuÿler)

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tf���� Third-Party Funds

DFG, Mikroskopische Charakterisierung von inkommensurablen Grenzflächen in moduliertenFehlpassungsschichtstrukturen mittels ultrahochauflösender Durchstrahlungselektronenmikroskopie,07.12.2007-31.01.2010 (150000 EUR)

HWT II ISH, TEM - Nanoanalytik zur Entwicklung von incoatec Synchrotronoptiken, 01.07.2007-31.08.2009 (96000EUR)

EU, MACAN - Merging Atomistic and Continuum Analysis of Nanometer Length-Scale Metal-Oxide Systems for Energyand Catalysis Applications, 01.07.2009-30.06.2013 (29158 EUR)

DAAD, Reisekostenzuschuss zur Teilnahme von Herrn Prof. Dr. Wolfgang Jäger an der 11th International Conference onAdvanced Materials ICAM 2009, Rio de Janeiro, Brasilien, 20.-25.09.2009 (1710 EUR)

DGE Deutsche Gesellschaft für Elektronenmikroskopie, Reisestipendium zur Teilnahme von Ulrich Roÿ an der MicroscopyConference MC 2009, Graz, Austria, 30.09.-04.10.2009 (500 EUR)

Ministerio de Ciencia e Innovacion, Madrid, Spain, Gastwissenschaftler Aufenthalt, Dr. Yanicet Ortega Villafuerte,10.02.-31.07.2009 (xxx EUR)

Ministerio de Ciencia e Innovacion, Madrid, Spain, Gastwissenschaftler Aufenthalt, Dr. David Maestre Varea,05.05.2009-30.04.2010 (xxx EUR)

CAU International Center, Exchange of scientists with the Zhejiang University, Hanzhou, V. R. China, M.S. Fu Liu,06.04.-30.09.2009 (xxx EUR)

� Further Cooperation, Consulting, and Technology Transfer

Technology-oriented collaborations with industry and external research institutes

Continued collaboration (consulting, application of high-resolution TEM methods) in the development of nanomaterialsfor high-capacity hydrogen storage (Dr. M. Dornheim, Dr. U. Bösenberg, GKSS Helmholtz Center Geesthacht, Dept.Nanotechnology).

Continued collaboration (consulting, application of high-resolution TEM methods) in the development of commercial X-rayoptical components with Incoatec GmbH Geesthacht (funding support by the ISH HWT program) and with the GKSSHelmholtz Center Geesthacht, Institute of Materials Research (Dr. M. Stoermer).

Collaboration with Fraunhofer Institute for Solar Energy Systems ISE, Dr. F. Dimroth, Dr. A. Bett, Prof. E. Weber on thedevelopment of concepts for defect engineering for high-efficiency solar cells (Dipl.-Ing. Ch. Dieker).

Collaboration with Fraunhofer Institute for Applied Solid State Physics IAF, Dr. O. Williams, Dr. A. Kriele, Prof. Ch. Nebel)on the development of diamond layers and nanodiamond (Dipl.-Ing. Ch. Dieker).

Further Collaborations with research institutions

Continued research collaboration on quantitative TEM characterisations of nanolayer systems for X-ray optics with Dr. C.Morawe, European Synchrotron Radiation Facility, Grenoble, France.

Continued research collaboration (started in 2008) with Physics Department, Universidad Complutense de Madrid, Spain,Prof. Dr. J. Piqueras, Prof. Y. Ortega Villafuerte, Dr. D. Maestre Varea on TEM characterisations of oxide semiconductornanomaterials.

Collaborations with Universities

Continued research collaboration (CAU funding support) with Materials Science and Engineering and State Key Laboratoryfor Silicon Materials, Zhejiang University, Hangzhou, China, Prof. Dr. X. Zhang, M.Sc. Fu Liu: TEM characterisation forprocessing of nanoparticle composites.

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tf���Co-supervision (Prof. W. Jäger) of PhD theses research work at the Max-Planck-Institute for Metal Research, Stuttgart,Germany (Stuttgart Center for Electron Microscopy Dr. P. van Aken, Dr. F. Philipp, Dr. W. Sigle) on TEM characterisationsof semiconductor heterostructures and of metal nanoparticles.

Analytical support (Dipl.-Ing. Ch. Dieker, with contributions by Dr. Ch. Zamponi from the Anorganic Functional MaterialsGroup) by materials analyses of an archaeological find (� Beil von Ahneby� ) for a research project of the ArchäologischesLandesmuseum (Dr. M. Freudenberg, Director Prof. Dr. C. v. Carnap-Bornheim).

DFG Graduate School Human Development in Landscapes at the CAU (Coordination Prof. J. Müller CAU) - lecture offers onmethods of electron microscopy and materials analysis. Member of the board of directors (Prof. W. Jäger).

� Dissertations / Postdoctoral Lecture Qualifications

Magnus Garbrecht, Aberration-corrected high-resolution transmission electron microscopy of the misfit layeredcompound (PbS)1.14NbS2, 17.04.2009

Jan Schöne, Kontrolle von Spannungsrelaxation und Defektbildung in metamorphen III-V Halbleiterheterostrukturen fürhocheffiziente Solarzellen (Bestbewertung opus eximium), 21.07.2009

� Publications

Published in 2009

D. Häuÿler, C. Morawe, U. Roÿ, B. Ögüt, E. Spiecker, W. Jäger, F. Hertlein, U. Heidorn, J. Wiesmann, Aperiodic W/B4Cmultilayer sytems for X-ray optics: Quantitative determination of layer thickness by HAADF-STEM and X-rayreflectivity, Surface and Coatings Technology, SCT-15339, (2009)

Y. Ortega, Ch. Dieker, P. Fernandez, J. Piqueras, W. Jäger, TEM and CL Investigation of Doped ZnO Nanostructures,Microscopy Conference MC 2009 Graz, Volume 3: Materials Science (ISBN 978-3-85125-062-6, DOI10.3217/978-3-85125-062-6, Verlag der TU Graz, Eds. W. Grogger, F. Hofer, P. Pölt), 3, 429 - 430 (2009)

U. Roÿ, D. Häuÿler, E. Spiecker, W. Jäger, B. Ögüt, C. Morawe, F. Hertlein, J. Wiesmann, U. Heidorn, Nano-ScaledAperiodic Multilayer Systems for X-ray Optics: Quantitative Layer Thickness Determination by HAADF-STEM,Microscopy Conference MC 2009 Graz, Volume 3: Materials Science (ISBN 978-3-85125-062-6, DOI10.3217/978-3-85125-062-6, Verlag der TU Graz, Eds. W. Grogger, F. Hofer, P. Pölt), 3, 443 - 444 (2009)

J. Schöne, Kontrolle von Spannungsrelaxation und Defektbildung in metamorphen III-V Halbleiterheterostrukturen fürhocheffiziente Solarzellen, Dissertation CAU Kiel, (2009)

M. Garbrecht, Aberration-corrected high-resolution transmission electron microscopy of the misfit layered compound(PbS)1.14NbS2, Dissertation CAU Kiel, (2009)

D. Häuÿler, U. Roÿ, B. Ögüt, E. Spiecker, W. Jäger, C. Morawe, F. Hertlein, J. Wiesmann, M. Störmer, QuantitativeTransmission Electron Microscopy of Multilayer Coatings for X-ray Optics, 11th Int. Conf. on Advanced MaterialsICAM2009, Rio de Janeiro, Brazil, (2009)

U. Roÿ, D. Häuÿler, E. Spiecker, W. Jäger, B. Ögüt, C. Morawe, F. Hertlein, J. Wiesmann, U. Heidorn, Nano-ScaledAperiodic Multilayer Systems for X-ray Optics: Quantitative Layer Thickness Determination by HAADF-STEM, Proc.1st MACAN Conference on Interfaces (FP7-NMP-2009-CSA-233484 MACAN), Berlin, Germany, 69, (2009)

Y.J. Zeng, Z.Z. Ye, F. Liu, D.Y. Li, Y.F. Lu, W. Jäger, H.P. He, L.P. Zhu, J.Y. Huang, B.H. Zhao, Controllable Growth andCharacterization of ZnO/MgO Quasi Core-Shell Quantum Dots, Crystal Growth and Design, 9, 263 - 266 (2009)

W. Jäger, E. Spiecker, D. Häuÿler, Faszination Nanokosmos - Elektronenmikroskopie und Nanoanalytik in derMaterialforschung, Christiana Albertina, 68, 17 (2009)

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tf���� Presentations

W. Jäger, Faszination Nanokosmos - Elektronenmikroskopie und Nanoanalytik in der Materialforschung, Vortragsreiheder Schleswig-Holsteinischen Universitätsgesellschaft, Elmshorn, Germany, 14.01.2009

D. Häuÿler, U. Roÿ, B. Ögüt, E. Spiecker, W. Jäger, C. Morawe, F. Hertlein, U. Heidorn, Aperiodic W/B4C MultilayerSystems for X-Ray Optics: Quantitative Determination of Layer Thickness by HRTEM, HAADF-STEM, and X-RayReflectivity, E-MRS 2009 Spring Meeting, Strasbourg, France, 07.-12.06.2009

U. Roÿ, D. Häuÿler, E. Spiecker, W. Jäger, B. Ögüt, C. Morawe, F. Hertlein, J. Wiesmann, U. Heidorn, Nano-ScaledAperiodic Multilayer Systems for X-ray Optics: Quantitative Layer Thickness Determination by HAADF-STEM,Microscopy Conference MC 2009, Graz, Austria, 29.08.-06.09.2009

D. Häuÿler, U. Roÿ, B. Ögüt, E. Spiecker, W. Jäger, C. Morawe, F. Hertlein, J. Wiesmann, M. Störmer, QuantitativeTransmission Electron Microscopy of Multilayer Coatings for X-ray Optics, 11th International Conference onAdvanced Materials ICAM 2009, Rio de Janeiro, Brazil, 20.-25.09.2009

U. Roÿ, D. Häuÿler, E. Spiecker, W. Jäger, B. Ögüt, C. Morawe, F. Hertlein, J. Wiesmann, U. Heidorn, Nano-ScaledAperiodic Multilayer Systems for X-ray Optics: Quantitative Layer Thickness Determination by HAADF-STEM,FP7-NMP-2009-CSA-233484 MACAN, 1st MACAN Conference on Interfaces, Harnack-Haus, Berlin, Germany,14.-17.11.2009

A. Kriele, W. Smirnov, M. Wolfer, O.A. Williams, J.J. Hees, N. Yang, Ch.E. Nebel, Ch. Dieker, W. Jäger, Diamond Foamfrom Nano-Crystalline Diamond Films, Mater. Res. Soc. Fall Meeting, Boston, U. S. A., 30.11.-04.12.2009

M. Garbrecht, E. Spiecker, K. Tillmann, W. Jäger, Quantitative Aberration-Corrected HRTEM Characterization of anIncommensurate Misfit Layered Compound, 14th Israel Materials Engineering Conference (IMEC-14), Tel-AvivUniversity, Tel-Aviv, Israel, 13.-14.12.2009

� Further Activities and EventsThe essential contributions to the development of the world-record solar cell with 41.1 % efficiency of the FraunhoferInstitute for Solar Energy Systems ISE (press release 14.1.2009, www.ise.fhg.de) by Dr. Jan Schöne (now at centrothermphotovoltaics technology GmbH, Konstanz, Germany) found widespread recognition also in the general public (KielerNachrichten 12.03.2009, �Weltrekord mit Kieler Hilfe� onside - schleswig-holstein innovativ 24 / March 2009, andinterview with Prof. Dr. E. Weber, Director of the Fraunhofer Institute for Solar Energy Systems ISE in: onside -Schleswig-holstein innovative 28 / Nov 2009, edited by ISH Innovationsstiftung Schleswig-Holstein www.i-sh.de). As partof his PhD thesis research, Jan Schoene applied high-resolution methods of transmission electron microscopy (TEM) todeveloping new concepts for defect engineering for high-efficiency solar cells (Almanach 2008 TF CAU Kiel).

Selection of Activities Prof. W. Jäger

Member of evaluation committee for a National Research Program of the Swiss National Science Foundation (SNSF),Berne, Switzerland.

Expert consultant for research funding agencies in Germany (DFG and others) and abroad.

Member of the Editorial Board of Springer Journal of Materials Science.

Reviewer for several international scientific journals.

Member of board of directors DFG CAU Graduate School �Human Development in Landscapes� .

Deutsche Gesellschaft für Elektronenmikroskopie(DGE) - German Society for Electron Microscopy: Invitation / preparativestages for the organisation of the Microscopy Conference MC 2011, Kiel, Germany, in collaboration with the Nordic Society(SCANDEM), Polish Microscopy Society (PTMi) and scientists from research institutions in Estonia, Latvia, Lithuania, andSt. Petersburg/Russia (28.08. - 02.09.2011). www.mc2011.de

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tf���European Materials Research Society E-MRS Spring Meeting 2010 (07. - 11.06.2010): Organization of a symposium on�Quantitative Electron Microscopy for Research and Industry� (co-chairmen R. Dunin-Borkowski CEN Technical University,Kongens Lyngby, Denmark, P. A. Midgley, University of Cambridge, UK, E. Snoeck CEMES-CNRS Toulouse, France).www.emrs-strasbourg.com

ICAM 2009 Int. Conference on Advanced Materials, Rio de Janeiro, Brazil (20. - 25.09.2009): Organisation of symposiumon �Advances on Nanocomposites: Synthesis and Applications� , Co-organisation: David C. Bell (Harvard, USA), LuizHenrique C. Mattoso (EMBRAPA, Brazil) / Invited presentation to symposium on �Protective Coating: Advanced SurfaceEngineering� / Invited presentation to Workshop �BMBF-DAAD-DFG - Advanced Materials Research in Germany at a Glance- Opportunities for Research Cooperation with Germany, Scholarship and Exchange Programs� . www.icam2009.com

MC 2009 Int. Microscopy Conference, Graz, Austria (30.08. - 04.09.2009): organisation of symposium on �ThinFilms and Interfaces� (Co-organisation: Natasa Bibic, VINCA Institute of Nuclear Sciences, Belgrade, Serbia).www.microscopy09.tugraz.at

Guests in 2009

Prof. Dr. W. Mader, Anorganic Chemistry, University of Bonn, Germany, on Oxide Semiconductors, 17. - 18.04.2009

Prof. Dr. U. Dahmen, LBL National Center for Electron Microscopy, Berkeley, USA, on Usage of TEAM Facility, 29. -30.04.2009

Prof. Dr. Dietrich Hesse, Max-Planck-Institut für Mikrostrukturphysik, Halle, Germany, Colloquium of the Faculty ofEngineering, �Laterally and vertically nanostructured ferroelectric, magnetic and multiferroic epitaxial complex oxideheterostructures� , 29.06.2009

Prof. Dr. Javier Piqueras, Dept. Materials Physics, University Complutense of Madrid, Madrid, Spain, on SemiconductorOxide Nanostructures, 13. 07.2009

Dr. Christian Kübel, Forschungszentrum Karlsruhe, Institute for Nanotechnology, Karlsruhe, Germany, Colloquium of theFaculty of Engineering �Electron Tomography in Materials Science� , 02.11.2009, and project collaboration discussion,21.12.2009

Offers for the general public and for schools

Prof. W. Jäger �Faszination Nanokosmos - Mit Elektronen zu den Grenzen des Sichtbaren� , �Good vibrations - mitElektronen Musik Sehen� , SHUG Schleswig-Holsteinische Universitätsgesellschaft and CAU Schüleruniversität.

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